WITec launches Digital Pulsed Force Mode

WITec GmbH introduced a fully digital Pulsed Force Mode (PFM) for Atomic Force Microscopy (AFM). New material properties formerly inaccessible with AFM can now be analyzed and imaged simultaneously with the topography. With the Digital Pulsed Force Mode it is possible to access all the information available in pulsed force and force distance curves. With a single measurement it is possible to acquire and image not only local stiffness and adhesion, but additional properties such as viscosity, energy dissipation, contact-time, long range forces, and many more. The electronics include a high speed data acquisition system, a freely programmable modulation generator, and a real-time data evaluation module. With storage of the complete measurement, post-processing data evaluation is easily possible.